The effects of carbon coating on nanoripples induced by focused ion beam

Guang Ran; Jiaming Zhang; Qiangmin Wei; Shengqi Xi; Xiaotao Zu; Lumin Wang
February 2009
Applied Physics Letters;2/16/2009, Vol. 94 Issue 7, pN.PAG
Academic Journal
The morphology and topography of self-assembled nanoripple structures on LaAlO3 (100) surface with and without carbon coating were characterized using focused ion beam (FIB)/scanning electron microscope, as well as ex situ atomic force microscopy and transmission electron microscopy. When the surface was not covered by carbon coating and had low roughness, well-ordered and highly uniform nanoripples self-assembled on the surface bombarded by FIB. In contrast, disordered nanoripples formed after carbon coating. The deposited carbon significantly influences the morphology of surface nanoripples due to its effect on the surface roughness that affect the dynamic competition between the roughening and smoothing processes. This discovery suggests a means for fabricating well-ordered and highly uniform nanoripples for nanoscale devices application.


Related Articles

  • Preparation and Microcosmic Structural Analysis of Recording Coating on Inkjet Printing Media. Bo Jiang; Weiyan Liu; Yongping Bai; Yudong Huang; Li Liu; Jianping Han // International Journal of Molecular Sciences;Aug2011, Vol. 12 Issue 8, p5422 

    Preparation of recording coating on inkjet printing (RC-IJP) media was proposed. The microstructure and roughness of RC-IJP was analyzed by scanning electron microscopy (SEM) and atomic force microscope (AFM). The surface infiltration process of RC-IJP was studied by a liquid infiltration...

  • Microscopic investigation of single-crystal diamond following ultrafast laser irradiation. Hsu, E.; Mailman, N.; Botton, G.; Haugen, H. // Applied Physics A: Materials Science & Processing;Apr2011, Vol. 103 Issue 1, p185 

    We present a structural investigation of single-crystal diamond following ultrafast laser irradiation of the surface and the bulk material. Optical microscopy, atomic force microscopy, scanning electron microscopy, and focused-ion beam and transmission electron microscopy techniques were...

  • Highly Uniform Epitaxial ZnO Nanorod Arrays for Nanopiezotronics. Volk, J.; Nagata, T.; Erdélyi, R.; Bársony, I.; Tóth, A. L.; Lukács, I. E.; Czigány, Zs.; Tomimoto, H.; Shingaya, Y.; Chikyow, T. // Nanoscale Research Letters;Jul2009, Vol. 4 Issue 7, p699 

    Highly uniform and c-axis-aligned ZnO nanorod arrays were fabricated in predefined patterns by a low temperature homoepitaxial aqueous chemical method. The nucleation seed patterns were realized in polymer and in metal thin films, resulting in, all-ZnO and bottom-contacted structures,...

  • Surface Morphology and Topology of TiO2 Nanocoating on Metal Substrates at Different Molar Concentrations and Speed. Achoi, Mohd F.; Nor, Asiah M.; Abdullah, S.; Rusop, M. // AIP Conference Proceedings;3/30/2011, Vol. 1328 Issue 1, p295 

    Mild steel is low carbon steel content of carbon less than 0.25 wt%. This type of steels is low cost to produce while has good toughness and outstanding ductility. Nanocoated mild steel surface is greatly many applications such as in automobile body component, pipelines, wall of operation's room...

  • Roughening instability and ion-induced viscous relaxation of SiO2 surfaces. Mayer, T. M.; Chason, E.; Howard, A. J. // Journal of Applied Physics;8/1/1994, Vol. 76 Issue 3, p1633 

    Deals with a study which characterized the development of nanometer scale topography (roughness) on silicon dioxide surfaces as a result of low energy, off-normal ion bombardment, using in situ energy dispersive x-ray reflectivity and atomic force microscopy. Evolution of surface morphology;...

  • Ion beam smoothing of indium-containing III-V compound semiconductors. Frost, F.; Schindler, A.; Bigl, F. // Applied Physics A: Materials Science & Processing;1998, Vol. 66 Issue 6, p663 

    Abstract. Reactive ion beam etching (RIBE) with N[sub 2] has been used for smoothing of rough InAs, InP, and InSb surfaces, prepared by argon ion beam etching (IBE). The evolution of the surface roughness and morphology has been studied by atomic force microscopy (AFM) as a function of the N[sub...

  • Evaluation and visualization of the percolating networks in multi-wall carbon nanotube/epoxy composites. Li Chang; Friedrich, Klaus; Lin Ye; Toro, Patricio // Journal of Materials Science;Aug2009, Vol. 44 Issue 15, p4003 

    In this study, epoxy-based nanocomposites containing multi-wall carbon nanotubes (CNTs) were produced by a calendering approach. The electrical conductivities of these composites were investigated as a function of CNT content. The conductivity was found to obey a percolation-like power law with...

  • Control of dense carbon nanotube arrays via hierarchical multilayer catalyst. Fisher, C.; Han, Z. J.; Levchenko, I.; Ostrikov, K. // Applied Physics Letters;10/3/2011, Vol. 99 Issue 14, p143104 

    Effective control of dense, high-quality carbon nanotube arrays using hierarchical multilayer catalyst patterns is demonstrated. Scanning/transmission electron microscopy, atomic force microscopy, Raman spectroscopy, and numerical simulations show that by changing the secondary and tertiary...

  • One-dimensional postwetting layer in InGaAs/GaAs(100) quantum-dot chains. Wang, Zh. M.; Mazur, Yu. I.; Shultz, J. L.; Salamo, G. J.; Mishima, T. D.; Johnson, M. B. // Journal of Applied Physics;2/1/2006, Vol. 99 Issue 3, p033705 

    Long chains of quantum dots formed in InGaAs/GaAs(100) multiple layers have been systematically investigated by scanning electron, transmission electron, and atomic force microscopies. In addition to the usual two-dimensional wetting layer involved in the Stranski-Krastanov growth, we have...


Read the Article


Sorry, but this item is not currently available from your library.

Try another library?
Sign out of this library

Other Topics