TITLE

Ferroelectric properties of Pb(Zr,Ti)O3 thin films until 40 GHz

AUTHOR(S)
Defaÿ, E.; Lacrevaz, T.; Vo, T. T.; Sbrugnera, V.; Bermond, C.; Aïd, M.; Fléchet, B.
PUB. DATE
February 2009
SOURCE
Applied Physics Letters;2/2/2009, Vol. 94 Issue 5, pN.PAG
SOURCE TYPE
Academic Journal
DOC. TYPE
Article
ABSTRACT
The radio frequency characterization of Cu/TiN/Pb(Zr,Ti)O3 stack on glass is performed using coplanar transmission lines. A dielectric relaxation is evidenced around 10 GHz by the correlated decrease in the dielectric constant K together with the dielectric losses increase versus frequency. This phenomenon is attributed to domain wall relaxation. The ferroelectric nature of Pb(Zr,Ti)O3 (PZT) thin films is observed until 40 GHz with a hysteresis curve of K versus dc bias. The high K value (K∼1200) combined with a high tunability (∼35%) and moderate losses (∼1%) suggest that PZT films could be well suited for tunable devices for frequencies lower than 5 GHz.
ACCESSION #
36534229

 

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