Phase transitions and the temperature dependence of the dielectric properties in tetragonally strained barium strontium titanate films

Alldredge, L. M. B.; Chang, Wontae; Kirchoefer, Steven W.; Pond, Jeffrey M.
February 2009
Applied Physics Letters;2/2/2009, Vol. 94 Issue 5, pN.PAG
Academic Journal
The dielectric properties of sputter-deposited Ba1-xSrxTiO3 (BST) thin films on (001) MgO substrates with in-plane or out-of-plane tetragonal lattice structure distortions were characterized as a function of temperature. A temperature-dependent interpolation calibration technique was developed for increased efficiency of the microwave measurements. The BST films showed significant differences in the ferroelectric phase transition due to lattice distortions with a strong temperature dependence of the in-plane dielectric behavior for films under tensile strain and a weak temperature dependence for films under compressive strain. The experimental data agreed well with theoretical modeling of the BST film strain effect based on Devonshire’s theory.


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