Chopper system for time resolved experiments with synchrotron radiation

Cammarata, Marco; Eybert, Laurent; Ewald, Friederike; Reichenbach, Wolfgang; Wulff, Michael; Anfinrud, Philip; Schotte, Friedrich; Plech, Anton; Kong, Qingyu; Lorenc, Maciej; Lindenau, Bernd; Räbiger, Jürgen; Polachowski, Stephan
January 2009
Review of Scientific Instruments;Jan2009, Vol. 80 Issue 1, pN.PAG
Academic Journal
A chopper system for time resolved pump-probe experiments with x-ray beams from a synchrotron is described. The system has three parts: a water-cooled heatload chopper, a high-speed chopper, and a millisecond shutter. The chopper system, which is installed in beamline ID09B at the European Synchrotron Radiation Facility, provides short x-ray pulses for pump-probe experiments with ultrafast lasers. The chopper system can produce x-ray pulses as short as 200 ns in a continuous beam and repeat at frequencies from 0 to 3 kHz. For bunch filling patterns of the synchrotron with pulse separations greater than 100 ns, the high-speed chopper can isolate single 100 ps x-ray pulses that are used for the highest time resolution. A new rotor in the high-speed chopper is presented with a single pulse (100 ps) and long pulse (10 μs) option. In white beam experiments, the heatload of the (noncooled) high-speed chopper is lowered by a heatload chopper, which absorbs 95% of the incoming power without affecting the pulses selected by the high speed chopper.


Related Articles

  • Inelastic x-ray scattering with fluorescence coincidence detection using a pulsed synchrotron source. Marchetti, Vincent; Franck, Carl // Review of Scientific Instruments;Mar88, Vol. 59 Issue 3, p407 

    We describe a system used to measure the spectrum of x rays scattered inelastically from K-shell electrons using a coincidence technique. The source of the x rays was a pulsed synchrotron source. We describe fast–slow coincidence logic adapted for use with a pulsed source of fluctuating...

  • Optical alignment device for x-ray diffraction systems. Prawer, S.; Wilkins, S. W. // Review of Scientific Instruments;Mar88, Vol. 59 Issue 3, p501 

    A device is described which enables x-ray diffraction systems to be aligned optically using a collimated laser beam to mimic the x-ray beam path through the system. Alignment using the device is faster and safer than the conventional procedures.

  • A simple microbeam profiling technique for x-ray optics. Lankosz, M.; Sieber, J. // Review of Scientific Instruments;Jul2000, Vol. 71 Issue 7 

    Enhancement of the quality of images or maps obtained using micro x-ray fluorescence spectrometry requires knowledge of the flux distribution profile of the primary x-ray beam. A simple procedure based on a wire scan was developed for the determination of an x-ray microbeam profile. This...

  • Measurements of 4–10 keV x-ray production with the Z-Beamlet laser. Ruggles, L. E.; Porter, J. L.; Rambo, P. K.; Simpson, W. W.; Vargas, M. F.; Bennett, G. R.; Smith, I. C. // Review of Scientific Instruments;Mar2003, Vol. 74 Issue 3, p2206 

    In order to characterize the current backlighting capability of Sandia's Z-Beamlet laser (ZBL) over a range of high photon energies, we measured the x-ray conversion efficiency of the focused 527 nm ZBL beam into 4-10 keV x rays from He-like emission of the elements Sc through Ge (excluding Ga)....

  • SuperMAXIMUM: A Schwarzschild-based, spectromicroscope for ELETTRA. Welnak, J.; Dong, Z.; Solak, H.; Wallace, J.; Cerrina, F.; Bertolo, M.; Bianco, A.; Di Fonzo, S.; Fontana, S.; Jark, W.; Mazzolini, F.; Rosei, R.; Savoia, A.; Underwood, J.H.; Margaritondo, G. // Review of Scientific Instruments;Feb1995, Vol. 66 Issue 2, p2273 

    Discusses the development of SuperMAXIMUM, a second-generation x ray scanning spectromicroscope that will be installed on the ELETTRA synchrotron radiation facility in Trieste, Italy. Source and beam line; Mechanics; Electron energy analyzer; Data acquisition.

  • Volume-variable sample holder for small-angle x-ray scattering measurements of supercritical solutions and its application to the CHF3–CO2 mixture. Morita, Takeshi; Masakawa, Tomoko; Arai, Asako Ayusawa; Nakagawa, Masato; Nishikawa, Keiko // Review of Scientific Instruments;Mar2005, Vol. 76 Issue 3, p033902 

    A sample holder for small-angle x-ray scattering (SAXS) experiments was designed for a volume-variable operation by using a metal bellows. The key point of our design is such that no backup pressure is required. This made the sample cell and peripherals compact so that it can be placed in a...

  • At-wavelength figure metrology of hard x-ray focusing mirrors. Yumoto, Hirokatsu; Mimura, Hidekazu; Matsuyama, Satoshi; Handa, Soichiro; Sano, Yasuhisa; Yabashi, Makina; Nishino, Yoshinori; Tamasaku, Kenji; Ishikawa, Tetsuya; Yamauchi, Kazuto // Review of Scientific Instruments;Jun2006, Vol. 77 Issue 6, p063712 

    We have developed an at-wavelength wave-front metrology of a grazing-incidence focusing optical systems in the hard x-ray region. The metrology is based on numerical retrieval from the intensity profile around the focal point. We demonstrated the at-wavelength metrology and estimated the surface...

  • A Bonse–Hart ultrasmall angle x-ray scattering instrument employing synchrotron and conventional x-ray sources. Chu, Benjamin; Li, Yingjie; Gao, Tong // Review of Scientific Instruments;Sep92, Vol. 63 Issue 9, p4128 

    A Bonse–Hart ultrasmall angle x-ray scattering (USAXS) instrument employing both synchrotron and conventional x-ray sources was constructed. The instrument could be used to determine the structure of systems with inhomogeneity sizes on the order of ∼1000 nm. The characteristics of...

  • Multipurpose furnace for in situ studies of polycrystalline materials using synchrotron radiation. Sharma, Hemant; Wattjes, Alix C.; Amirthalingam, Murugaiyan; Zuidwijk, Thim; Geerlofs, Nico; Offerman, S. Erik // Review of Scientific Instruments;Dec2009, Vol. 80 Issue 12, p123301 

    We report a multipurpose furnace designed for studies using synchrotron radiation on polycrystalline materials, namely, metals, ceramics, and (semi)crystalline polymers. The furnace has been designed to carry out three-dimensional (3D) x-ray diffraction measurements but can also be used for...


Read the Article


Sorry, but this item is not currently available from your library.

Try another library?
Sign out of this library

Other Topics