TITLE

Visual observation and quantitative measurement of the microwave absorbing effect at X band

AUTHOR(S)
Zhao, L.; Chen, X.; Ong, C. K.
PUB. DATE
December 2008
SOURCE
Review of Scientific Instruments;Dec2008, Vol. 79 Issue 12, p124701
SOURCE TYPE
Academic Journal
DOC. TYPE
Article
ABSTRACT
We have set up a two-dimensional spatial field mapping system to measure graphically the quasi-free-space electromagnetic wave in a parallel plate waveguide. Our apparatus illustrates a potential application in characterizing the microwave absorbing materials. From the measured mappings of the microwave field, the visualization of spatial physical process and quantitative characterization of reflectivity coefficients can be achieved. This simple apparatus has a remarkable advantage over with conventional testing methods which usually involve huge, expensive anechoic chambers and demand samples of large size.
ACCESSION #
35982694

 

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