Direct calibration of colloidal probe cantilevers via Derjaguin, Landau, Verwey, and Overbeek surface forces in electrolyte solution

Hong, Xiaoting; Willing, Gerold A.
December 2008
Review of Scientific Instruments;Dec2008, Vol. 79 Issue 12, p123709
Academic Journal
The development of colloidal probe microscopy has made it possible to directly measure the interaction forces between two different surfaces in solution. Cantilever calibration is presently a subject of intense experimental and theoretical interest due to the need for accurate force measurement. We developed a novel and direct calibration method for colloidal probe cantilevers to which a silica microsphere has been previously attached based on fitting experimental force curves for the interaction between the silica sphere and a silica flat in dilute KBr solutions to the theoretical Derjaguin, Landau, Verwey, and Overbeek force curves using the measured zeta potential of the silica surfaces.


Related Articles

  • A direct micropipette-based calibration method for atomic force microscope cantilevers. Baoyu Liu; Yan Yu; Da-Kang Yao; Jin-Yu Shao // Review of Scientific Instruments;Jun2009, Vol. 80 Issue 6, p065109 

    In this report, we describe a direct method for calibrating atomic force microscope (AFM) cantilevers with the micropipette aspiration technique (MAT). A closely fitting polystyrene bead inside a micropipette is driven by precisely controlled hydrostatic pressures to apply known loads on the...

  • Note: Lateral force microscope calibration using multiple location pivot loading of rectangular cantilevers. Koo-Hyun Chung; Reitsma, Mark G. // Review of Scientific Instruments;Feb2010, Vol. 81 Issue 2, p026104 

    This note outlines a calibration method for atomic force microscope friction measurement that uses the “pivot” method of [Bogdanovic et al., Colloids Surf. B 19, 397 (2000)] to generate optical lever sensitivities for known torque applied to rectangular cantilevers. We demonstrate...

  • Reconstructed silicon surfaces for calibration of scanning tunnel microscopes. Kuzin, A.; Todua, P.; Panov, V.; Oreshkin, A. // Measurement Techniques;Oct2012, Vol. 55 Issue 7, p773 

    The feasibility of using a reconstructed 7×7-Si(111) surface and monatomic steps on this surface as reference samples for calibration of ultrahigh vacuum scanning tunneling microscopes is demonstrated.

  • Lateral force microscope calibration using a modified atomic force microscope cantilever. Reitsma, M. G. // Review of Scientific Instruments;Oct2007, Vol. 78 Issue 10, p106102 

    A proof-of-concept study is presented for a prototype atomic force microscope (AFM) cantilever and associated calibration procedure that provide a path for quantitative friction measurement using a lateral force microscope (LFM). The calibration procedure is based on the method proposed by...

  • Lateral Force Calibration Method Used for Calibration of Atomic Force Microscope. Ekwińska, Magdalena; Rymuza, Zygmunt // Journal of Telecommunications & Information Technology;2009, Vol. 2009 Issue 4, p83 

    Modern heterogeneous micro- and nanostructures usually integrate modules fabricated using various materials and technologies. Moreover, it has to be emphasized that the macro and micro nanoscale material parameters are not the same. For this reason it has become crucial to identify the...

  • Noncontact-mode scanning capacitance force microscopy towards quantitative two-dimensional carrier profiling on semiconductor devices. Kimura, Kenjiro; Kobayashi, Kei; Matsushige, Kazumi; Usuda, Koji; Yamada, Hirofumi // Applied Physics Letters;2/19/2007, Vol. 90 Issue 8, p083101 

    Scanning capacitance force microscopy (SCFM) is a promising tool for investigation of two-dimensional carrier density distribution on semiconducting devices. Its sensitivity is strongly dependent on the Q factor of the mechanical resonance mode of the cantilever. Therefore, measurement in vacuum...

  • Influence of atomic force microscope cantilever tilt and induced torque on force measurements. Edwards, Scott A.; Ducker, William A.; Sader, John E. // Journal of Applied Physics;Mar2008, Vol. 103 Issue 6, p064513 

    Quantitative force measurements performed using the atomic force microscope (AFM) inherently rely on calibration of the AFM cantilever spring constant to convert the measured deflection into a force. Here, we examine the effect of cantilever tilt and induced torque on the effective normal spring...

  • Optical lever calibration in atomic force microscope with a mechanical lever. Xie, Hui; Vitard, Julien; Haliyo, Sinan; Régnier, Stéphane // Review of Scientific Instruments;Sep2008, Vol. 79 Issue 9, p096101 

    A novel method that uses a small mechanical lever has been developed to directly calibrate the lateral sensitivity of the optical lever in the atomic force microscope (AFM). The mechanical lever can convert the translation into a nanoscale rotation angle with a flexible hinge that provides an...

  • High speed atomic force microscopy enabled by a sample profile estimator. Huang, Peng; Andersson, Sean B. // Applied Physics Letters;5/27/2013, Vol. 102 Issue 21, p213118 

    In this paper, an estimation scheme for imaging in Atomic Force Microscopy (AFM) is presented which yields imaging rates well beyond the bandwidth of the vertical positioner and allows for high-speed AFM on a typical commercial instrument. The estimator can be applied to existing instruments...


Read the Article


Sorry, but this item is not currently available from your library.

Try another library?
Sign out of this library

Other Topics