TITLE

Infrared spectroscopy of the interface charge in a ZnO field-effect transistor

AUTHOR(S)
Jooyoun Kim; SungHoon Jung; Choi, E. J.; Kitae Kim; Kimoon Lee; Seongil Im
PUB. DATE
December 2008
SOURCE
Applied Physics Letters;12/15/2008, Vol. 93 Issue 24, p241902
SOURCE TYPE
Academic Journal
DOC. TYPE
Article
ABSTRACT
We used far-infrared transmission spectroscopy to probe the electrostatically induced charge carriers in a ZnO field-effect transistor. The carrier absorption spectrum exhibits a non-Drude, incoherent conduction behavior at low gate-source voltages (VGS<40 V), which evolves toward a standard Drude behavior as VGS is increased. This change is explained successfully by a generalized Drude model. We find that the interface carriers undergo strong backscattering collisions during the channel conduction and the microscopic scattering angle changes with VGS.
ACCESSION #
35922174

 

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