TITLE

Dynamic NanoSIMS ion imaging of unicellular freshwater algae exposed to copper

AUTHOR(S)
Slaveykova, Vera I.; Guignard, Cédric; Eybe, Tanja; Migeon, Henri-Noël; Hoffmann, Lucien
PUB. DATE
January 2009
SOURCE
Analytical & Bioanalytical Chemistry;Jan2009, Vol. 393 Issue 2, p583
SOURCE TYPE
Academic Journal
DOC. TYPE
Article
ABSTRACT
This work demonstrates the capabilities of nanoscale secondary-ion mass spectrometry, using the Cameca NanoSIMS50 ion microprobe, to detect and image the copper-ion distribution in microalgal cells exposed to nanomolar and micromolar copper concentrations. In parallel to 63Cu− secondary-ion maps, images of 12C−, 12C14N−, and 31P− secondary ions were collected and analysed. A correlation of 63Cu− secondary-ion maps with those found for 12C14N− and 31P− demonstrated the possible association of Cu with cell components rich in proteins and phosphorus. The results highlighted the potential of NanoSIMS for intracellular tracking of essential trace elements such as Cu in single cells of the microalga Chlorella kesslerii. [Figure not available: see fulltext.]
ACCESSION #
35774234

 

Related Articles

  • Depth profile characterization of ultra shallow junction implants. Hönicke, Philipp; Beckhoff, Burkhard; Kolbe, Michael; Giubertoni, Damiano; van den Berg, Jaap; Pepponi, Giancarlo // Analytical & Bioanalytical Chemistry;Apr2010, Vol. 396 Issue 8, p2825 

    A need for analysis techniques, complementary to secondary ion mass spectrometry (SIMS), for depth profiling dopants in silicon for ultra shallow junction (USJ) applications in CMOS technologies has recently emerged following the difficulties SIMS is facing there. Grazing incidence X-ray...

  • Reply to 'Oxygen isotope heterogeneity of the mantle beneath the Canary Islands: a discussion of the paper of Gurenko et al.'. Gurenko, Andrey; Bindeman, Ilya; Chaussidon, Marc // Contributions to Mineralogy & Petrology;Jul2012, Vol. 164 Issue 1, p185 

    The comment by Day et al. (Contrib Mineral Petrol, ) (1) discusses the validity of the previously obtained oxygen isotope data for El Hierro and La Palma (Canary Island) olivines, (2) questions the approach by Gurenko et al. (Contrib Mineral Petrol 162:349-363, ) of using weakly correlated...

  • Using Direct Solid Sampling ICP-MS to Complement SEM-EDX and SIMS in Characterizing Semiconductor Materials. Fuhe Li, N.V.; Anderson, Scott // AIP Conference Proceedings;2003, Vol. 683 Issue 1, p715 

    The coupling of laser ablation systems with inductively coupled plasma (ICP) mass spectrometry has been done for many years, however the quantitative aspects as well as the applications have often been limited. Recently, LA ICP-MS has been developed into a valuable analytical tool in our...

  • Composition and strain contrast of Si1-xGex (x=0.20) and Si1-yCy (y≤0.015) epitaxial strained films on (100) Si in annular dark field images. Wu, X.; Baribeau, J.-M. // Journal of Applied Physics;Feb2009, Vol. 105 Issue 4, pN.PAG 

    The annular dark field (ADF) image contrast of Si1-xGex (x=0.20) and Si1-yCy (y≤0.015) strained epitaxial films on (100) Si is investigated in a 200 kV scanning transmission electron microscope (STEM) with ADF detector inner semiangles ranging from 26 to 92 mrad. For the Si1-xGex/Si...

  • Formation of low-resistance Ohmic contacts to N-face n-GaN for high-power GaN-based vertical light-emitting diodes. Jeon, Joon-Woo; Park, Seong-Han; Jung, Se-Yeon; Lee, Sang Youl; Moon, Jihyung; Song, June-O; Seong, Tae-Yeon // Applied Physics Letters;8/30/2010, Vol. 97 Issue 9, p092103 

    We report on the formation of low-resistance Ohmic contacts to N-face n-GaN for high-power vertical light-emitting diodes using an Al–Ga solid solution (50 nm)/Ti(30 nm)/Al(200 nm) scheme and compare them with Ti(30 nm)/Al(200 nm) contacts. The Al–Ga solid solution layer is...

  • Use of Drop-on-Demand Inkjet Printing Technology to Produce Trace Metal Contamination Standards For the Semiconductor Industry. Windsor, Eric; Fahey, Albert; Gillen, Greg // AIP Conference Proceedings;9/26/2007, Vol. 931 Issue 1, p146 

    The feasibility of using piezoelectric drop-on-demand inkjet printing technology to produce trace metal contamination standards on silicon wafers has been demonstrated. Prototype standards of Fe and Cu contamination with surface concentrations between 1013 atoms/cm2 and 1015 atoms/cm2 have been...

  • Formation mechanism of cerium oxide-doped indium oxide/Ag Ohmic contacts on p-type GaN. Leem, Dong-Seok; Kim, Tae-Wook; Lee, Takhee; Jang, Ja-Soon; Ok, Young-Woo; Seong, Tae-Yeon // Applied Physics Letters;12/25/2006, Vol. 89 Issue 26, p262115 

    The authors report on the formation of cerium oxide-doped indium oxide(2.5 nm)/Ag(250 nm) contacts to p-GaN. The contacts become Ohmic with a specific contact resistance of 3.42×10-4 Ω cm2 upon annealing at 530 °C in air. X-ray photoemission spectroscopy (XPS) Ga 3d core levels...

  • Investigation of Contemporary Forgeries of Ancient Silver Coins. Kraft, Gunther; Flege, Stefan; Reiff, Fritz; Ortner, Hugo M. // Microchimica Acta;Apr2004, Vol. 145 Issue 1-4, p87 

    Four ancient Roman silver coins from about 200 BC to 200 AD, mainly contemporary forgeries, were investigated in order to deduce the methods and materials used in the production of the forged coins. Special attention was devoted to a Denar from the Roman Republic, a C. Mamilius Limetanus...

  • Facing Hazardous Matter in Atmospheric Particles with NanoSIMS. Krein, Andreas; Audinot, Jean-Nicolas; Migeon, Henry-Noíl; Hoffmann, Lucien // Environmental Science & Pollution Research;Jan2007, Vol. 14 Issue 1, p3 

    The article features air pollution and particulate matter research. A research conducted in Western Europe shows that fine particulate matter penetrates into the lungs that may result in premature death, cardiopulmonary diseases and other lung related illnesses. The research method such as...

Share

Read the Article

Courtesy of THE LIBRARY OF VIRGINIA

Sorry, but this item is not currently available from your library.

Try another library?
Sign out of this library

Other Topics