TITLE

Thickness dependent transport properties and percolative phase separation in polycrystalline manganite thin films

AUTHOR(S)
Chen, Y. H.; Wu, T. B.
PUB. DATE
December 2008
SOURCE
Applied Physics Letters;12/1/2008, Vol. 93 Issue 22, p224104
SOURCE TYPE
Academic Journal
DOC. TYPE
Article
ABSTRACT
The effects of film thicknesses on the electronic transport and percolative metal-insulator (M-I) transition of La1-xSrxMnO3 (LSMO) films have been investigated. The conductivity increases with the layer thickness; this is regarded as the relaxation of tensile strains and reduction in grain boundaries (fewer scattering centers) as well as shorter hopping distances, which suppresses the Jahn–Teller distortion or enhances the double exchange. It is also observed by conductive atomic force microscopy (CAFM) that metallic and insulating regions coexist in LSMO films. The domains undergo a percolative M-I transition, and TM-I observed by CAFM is consistent with the result of four-point probe measurements.
ACCESSION #
35763855

 

Related Articles

  • Influence of spring stiffness and anisotropy on stick-slip atomic force microscopy imaging. Kerssemakers, J.; De Hosson, J. Th. M. // Journal of Applied Physics;7/15/1996, Vol. 80 Issue 2, p623 

    Deals with a study which analyzed high-load friction atomic force microscopy images of layered structures in terms of discrete stick-slip model. Description of a two-dimensional stick-slip behavior; Experimental details; Conclusions.

  • Characterization of local electrical properties of polycrystalline silicon thin films and hydrogen termination effect by conductive atomic force microscopy. Machida, Emi; Uraoka, Yukiharu; Fuyuki, Takashi; Kokawa, Ryohei; Ito, Takeshi; Ikenoue, Hiroshi // Applied Physics Letters;5/4/2009, Vol. 94 Issue 18, p182104 

    We observed local electrical properties of polycrystalline silicon films by conductive atomic force microscopy. Moreover, we investigated the effects of hydrogen termination on the polycrystalline silicon films. Before hydrogen termination, conductive regions in grain disappeared with the...

  • Modification of the Structure and Nano-Mechanical Properties of LiF Crystals Under Irradiation with Swift Heavy Ions. MANIKS, Jānis; MANIKA, Ilze; ZABELS, Roberts; SCHWARTZ, Rolands; SOROKIN, Michael; SCHWARTZ, Kurt // Materials Science / Medziagotyra;2011, Vol. 17 Issue 3, p223 

    The modifications of the structure and hardness of LiF crystals under high-fluence irradiation with MeV- and GeVenergy Au ions have been studied using nanoindentation and atomic force microscopy. The formation of ion-induced dislocations and bulk nanostructures consisting of grains with...

  • Epitaxial layer thickness measurement by cross-sectional atomic force microscopy. Howard, A.J.; Blum, O.; Chui, H.; Baca, A.G.; Crawford, M.H. // Applied Physics Letters;6/3/1996, Vol. 68 Issue 23, p3353 

    Develops an epitaxial layer thickness measurement technique using cross-sectional atomic force microscopy. Analysis of the cleaved and etched epitaxial heterostructures; Observation of a structure consisting of gallium arsenide wells; Comparison of the measured thickness with photoluminescence...

  • Contact stiffness of layered materials for ultrasonic atomic force microscopy. Yaralioglu, G. G.; Degertekin, F. L. // Journal of Applied Physics;5/15/2000, Vol. 87 Issue 10, p7491 

    Presents information on a study which calculated the contact stiffness between layered material and an ultrasonic atomic force microscope tip. Radiation impedance method for calculation of surface stiffness; Results and discussion; Conclusions.

  • Inhomogeneity of the pseudogap state of a doped layered cuprate antiferromagnet. Sergeeva, G.G. // Low Temperature Physics;Nov2003, Vol. 29 Issue 11, p895 

    The features of the pseudogap state in doped layered cuprate antiferromagnets and underdoped high-T[sub c] superconductors (HTSCs) are investigated. It is shown that the transition to the pseudogap state is a dimensional crossover from three-dimensional motion to two-dimensional motion of...

  • Atomic force microscopy observation of the Jahn-Teller instability in spinel LiMn2O4 embedded in silicon substrates. Kuriyama, K.; Onoue, A.; Yuasa, Y.; Kushida, K. // AIP Conference Proceedings;2007, Vol. 893 Issue 1, p1481 

    Surface morphology of 3.5×3.5 μm2 area of spinel LiMn2O4 embedded in Si substrates, a typical cathode material for Li ion secondary batteries, is studied using an atomic force microscopy (AFM) with a conductive probe. Under the negative bias voltage to attract Li+ ions, electric current...

  • Rapid ion-beam-induced Ostwald ripening in two dimensions. Berdahl, P.; Reade, R. P.; Russo, R. E. // Journal of Applied Physics;5/15/2005, Vol. 97 Issue 10, p10R503 

    Ion-beam-induced grain coarsening in initially amorphous (Zr,Y)Ox layers is observed by atomic force microscopy. The films were bombarded at room temperature. Grain-boundary grooves indicate that the larger grains have a diameter of about 83 nm at 2 min, and 131 nm at 5 min. Up to 5 min, the...

  • Evaluating the Plastic Anisotropy of AZ31 Using Microscopy Techniques. Chen, Z.; Boehlert, C. // JOM: The Journal of The Minerals, Metals & Materials Society (TM;Sep2013, Vol. 65 Issue 9, p1237 

    The tensile deformation mechanism of a rolled AZ31 alloy at 50°C, 150°C, and 250°C was investigated by a combination of in situ tensile testing, electron backscatter diffraction analysis, and ex situ atomic force microscopy analysis. With increasing temperature, there was a significant...

Share

Read the Article

Courtesy of VIRGINIA BEACH PUBLIC LIBRARY AND SYSTEM

Sorry, but this item is not currently available from your library.

Try another library?
Sign out of this library

Other Topics