TITLE

Electromigration-induced shock waves on metal thin films

AUTHOR(S)
Bradley, R. Mark
PUB. DATE
November 2008
SOURCE
Applied Physics Letters;11/24/2008, Vol. 93 Issue 21, p213105
SOURCE TYPE
Academic Journal
DOC. TYPE
Article
ABSTRACT
It is shown that surface electromigration can produce shock waves that retain their form as they propagate on the edge of a single-crystal metal thin film. We explain why these shocks form, determine their velocity, and find their internal structure. If two shocks are present initially, they collide and fuse to form a single shock.
ACCESSION #
35605062

 

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