Scaling behaviors of reset voltages and currents in unipolar resistance switching

Lee, S. B.; Chae, S. C.; Chang, S. H.; Lee, J. S.; Seo, S.; Kahng, B.; Noh, T. W.
November 2008
Applied Physics Letters;11/24/2008, Vol. 93 Issue 21, p212105
Academic Journal
The wide distributions of switching voltages in unipolar switching currently pose major obstacles for scientific advancement and practical applications. Using NiO capacitors, we investigated the distributions of the reset voltage and current. We found that they scaled with the resistance value Ro in the low resistance state and that the scaling exponents varied at Ro≈30 Ω. We explain these intriguing scaling behaviors and their crossovers by analogy with percolation theory. We show that the connectivity of conducting filaments plays a crucial role in the reset process.


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