TITLE

Influence of strong electric fields on the growth, modification, and destruction of thin oxide films at the titanium surface

AUTHOR(S)
Kovalevskii, S. A.; Dalidchik, F. I.; Grishin, M. V.; Gatin, A. K.
PUB. DATE
November 2008
SOURCE
Applied Physics Letters;11/17/2008, Vol. 93 Issue 20, p203112
SOURCE TYPE
Academic Journal
DOC. TYPE
Article
ABSTRACT
The influence of strong electric fields (∼107 V/cm) on the growth, modification, and destruction of thin oxide films at the metal surfaces are studied for a titanium tip of a scanning tunneling microscope (STM) oxidized in oxygen at different tip potentials. The spectroscopic measurements show that, in sufficiently strong fields (V≤-7.5 V) preventing migration of oxygen ions from the surface to bulk, the dielectric oxide films can form even for exposures of ∼10 L. At voltages V>-7.5 V, i.e., at lower fields, as well as for the opposite polarity, the conducting oxide films containing predominantly Ti+2 and Ti+3 ions are formed at the tip for the same exposures. The possibility of structural modification in the electric field of STM is demonstrated for titanium nanooxides.
ACCESSION #
35514081

 

Related Articles

Share

Read the Article

Courtesy of VIRGINIA BEACH PUBLIC LIBRARY AND SYSTEM

Sorry, but this item is not currently available from your library.

Try another library?
Sign out of this library

Other Topics