Aberration-free imaging for light and electrons

Fluegel, B.; Mascarenhas, A.
October 2008
Applied Physics Letters;10/20/2008, Vol. 93 Issue 16, p161105
Academic Journal
The equations for refraction of either the extraordinary wave of light or the wavefunction of an electron at a planar boundary between two misoriented uniaxially anisotropic materials are shown via raytracing to yield a transverse displacement of the object point. The displacement is independent of ray incidence angle and is thus free from spherical aberration, yielding a perfect virtual image which can have applications in birefringent optics. The general conditions for this aberration-free imaging are found to be identical to those required for amphoteric total refraction.


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