TITLE

Aberration-free imaging for light and electrons

AUTHOR(S)
Fluegel, B.; Mascarenhas, A.
PUB. DATE
October 2008
SOURCE
Applied Physics Letters;10/20/2008, Vol. 93 Issue 16, p161105
SOURCE TYPE
Academic Journal
DOC. TYPE
Article
ABSTRACT
The equations for refraction of either the extraordinary wave of light or the wavefunction of an electron at a planar boundary between two misoriented uniaxially anisotropic materials are shown via raytracing to yield a transverse displacement of the object point. The displacement is independent of ray incidence angle and is thus free from spherical aberration, yielding a perfect virtual image which can have applications in birefringent optics. The general conditions for this aberration-free imaging are found to be identical to those required for amphoteric total refraction.
ACCESSION #
35279344

 

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