Fabrication of 0.5 nm electrode gaps using self-breaking technique

Tsutsui, Makusu; Taniguchi, Masateru; Kawai, Tomoji
October 2008
Applied Physics Letters;10/20/2008, Vol. 93 Issue 16, p163115
Academic Journal
Control of electrode gap size formed by a self-breaking method is explored by statistically investigating electric field dependence of the gap distance using nanofabricated mechanically controllable break junctions. We obtained narrow distributions of the electrode gap size around 0.5 nm at biases below a threshold field. The self-breaking technique has thus been demonstrated to be a reliable tool for fabricating electrodes with subnanometer size gaps.


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