TITLE

Determination of the intershell conductance in a multiwall carbon nanotube

AUTHOR(S)
Stetter, A.; Vancea, J.; Back, C. H.
PUB. DATE
October 2008
SOURCE
Applied Physics Letters;10/27/2008, Vol. 93 Issue 17, p172103
SOURCE TYPE
Academic Journal
DOC. TYPE
Article
ABSTRACT
We have measured the current induced voltage drop along an individual multiwall carbon nanotube as a function of the distance to the current injecting electrode. The measurements have been performed at room temperature using scanning probe potentiometry combined with scanning electron microscopy. For a nanotube with an incomplete outer shell, a sharp potential jump was observed at the end of the outermost shell. The electric potential variation along the carbon nanotube has been used to determine the contact resistance between metal electrodes and the tube, the intrashell resistance, and the intershell conductance.
ACCESSION #
35279126

 

Related Articles

  • Robust Ohmic contact junctions between metallic tips and multiwalled carbon nanotubes for scanned probe microscopy. Kim, Suenne; Kim, Jeehoon; Berg, Morgann; de Lozanne, Alex // Review of Scientific Instruments;Oct2008, Vol. 79 Issue 10, p103702 

    We demonstrate a simple method that uses a scanning electron microscope for making a reliable low resistance contact between a single multiwalled carbon nanotube and a metallic tungsten probe tip or a Si cantilever. This method consists of using electron beam induced decomposition of background...

  • Growth of Pd-Filled Carbon Nanotubes on the Tip of Scanning Probe Microscopy. Sakamoto, Tomokazu; Chiu, Chien-Chao; Tanaka, Kei; Yoshimura, Masamichi; Ueda, Kazuyuki // Journal of Nanomaterials;2009, Special section p1 

    We have synthesized Pd-filled carbon nanotubes (CNTs) oriented perpendicular to Si substrates using a microwave plasmaenhanced chemical vapor deposition (MPECVD) for the application of scanning probe microscopy (SPM) tip. Prior to the CVD growth, Al thin film (10 nm) was coated on the substrate...

  • The Superior Surface Discharge Capacity of Core-Shell Tinoxide/Multi Walled Carbon Nanotube Nanocomposite Anodes for Li-Ion Batteries. AKBULUT, H.; ALAF, M.; GULTEKIN, D. // Acta Physica Polonica, A.;Feb2014, Vol. 125 Issue 2, p335 

    In this study, tin/tinoxide/multiwalled carbon nanotube (Sn/SnO2/MWCNT) nanocomposites were produced as anode materials for Li-ion batteries by a two-step process. Metallic tin was evaporated onto free-standing MWCNT buckypapers having controlled porosity and subsequently rf plasma oxidized in...

  • Probe Microscopic Studies of DNA Molecules on Carbon Nanotubes. Kazuo Umemura; Katsuki Izumi; Shusuke Oura // Nanomaterials (2079-4991);Oct2016, Vol. 6 Issue 10, p1 

    Hybrids of DNA and carbon nanotubes (CNTs) are promising nanobioconjugates for nanobiosensors, carriers for drug delivery, and other biological applications. In this review, nanoscopic characterization of DNA-CNT hybrids, in particular, characterization by scanning probe microscopy (SPM), is...

  • Noninvasive imaging of signals in digital circuits. Gebrial, W.; Prance, R. J.; Clark, T. D.; Harland, C. J.; Prance, H.; Everitt, M. // Review of Scientific Instruments;Mar2002, Vol. 73 Issue 3, p1293 

    In this article we describe the construction and use of a noninvasive (noncontact) electric potential probe to measure time delays of signals propagating through digital circuits. As we show, by incorporating such probes into a scanning microscope system we have been able to create time delay...

  • Measuring electrical current during scanning probe oxidation. Pérez-Murano, F.; Martın, C.; Barniol, N.; Kuramochi, H.; Yokoyama, H.; Dagata, J. A. // Applied Physics Letters;5/5/2003, Vol. 82 Issue 18, p3086 

    Electrical current is measured during scanning probe oxidation by performing force versus distance curves under the application of a positive sample voltage. It is shown how the time dependence of the current provides information about the kinetics of oxide growth under conditions in which the...

  • A flexible implementation of scanning probe microscopy utilizing a multifunction system linked to a PC-Pentium controller Barchesi, C.; Cricenti, A.; Generosi, R.; Giammichele, C.; Luce, M.; Rinaldi, M. // Review of Scientific Instruments;Oct97, Vol. 68 Issue 10, p3799 

    Develops a flexible electronic setup on a PC platform and the software implementation in Windows Microsoft environment, for a multipurpose head for scanning probe microscopy (SPM). Integrated, multiapplication data acquisition system linked to a PC-Pentium controller, through a digital I/O...

  • Mercury cadmium telluride/tellurium intergrowths in HgCdTe epilayers grown by molecular-beam epitaxy. Aoki, T.; Smith, David J.; Chang, Y.; Zhao, J.; Badano, G.; Grein, C.; Sivananthan, S. // Applied Physics Letters;4/7/2003, Vol. 82 Issue 14, p2275 

    Surface crater defects in HgCdTe epilayers grown by molecular-beam epitaxy have been investigated using cross-sectional scanning and transmission electron microscopy, as well as atomic force microscopy. These defects originated primarily within the HgCdTe films, and were shown to be associated...

  • Appearance-potential spectroscopy and work function. Gordon, R. L. // Journal of Applied Physics;2/15/1987, Vol. 61 Issue 4, p1523 

    Presents details of a method for the measurement of appearance potential at high spatial resolution on an unmodified Physical Electronics Industries Model 590 scanning Auger microprobe (PHI-590 SAM). Physical limitations involved in relating appearance-potential measurements to surface work...

Share

Read the Article

Courtesy of VIRGINIA BEACH PUBLIC LIBRARY AND SYSTEM

Sorry, but this item is not currently available from your library.

Try another library?
Sign out of this library

Other Topics