The use and characterization of a backilluminated charge-coupled device in investigations of pulsed x-ray and radiation sources

Fullagar, Wilfred; Uhlig, Jens; Walczak, Monika; Canton, Sophie; Sundström, Villy
October 2008
Review of Scientific Instruments;Oct2008, Vol. 79 Issue 10, p103302
Academic Journal
Examinations of bremsstrahlung and energetic electron beams from a novel laser plasma source motivate and assist characterization of a backthinned, backilluminated direct detection x-ray charge-coupled device (CCD), a topology that is uncommon in hard x-ray work. Behavior toward pseudomonochromatic (55Fe) and multichromatic (241Am) sources is briefly reviewed under optimized noise conditions. Results collectively establish the previously unknown functional depth structure. Several modes of usage are illustrated in ∼4–20 keV x-ray laser plasma source investigations, where the significance of the characterization is briefly discussed. The spectral redistribution associated with this CCD topology is unfavorable, yet appropriate analysis ensures that sufficient spectral information remains for quantitative determination of broadband x-ray flux and spectra in essentially single laser shot measurements. The energy dependence of nascent electron cloud radii in silicon is determined using broadband x-rays from the laser plasma source, turning the narrow depletion depth to advantage. Finally, the characterization is used to quantify recent x-ray spectral explorations of the water jet laser plasma source operating under aspirator vacuum. These results will have key value for establishment of laboratory based ultrafast extended x-ray absorption fine structure experiments using microbolometric detectors.


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