Correlated reduction in micropipe cross sections in SiC growth

Gutkin, M. Yu.; Sheinerman, A. G.; Smirnov, M. A.; Kohn, V. G.; Argunova, T. S.; Je, J. H.; Jung, J. W.
October 2008
Applied Physics Letters;10/13/2008, Vol. 93 Issue 15, p151905
Academic Journal
We reveal a correlated reduction in the cross sections of two neighboring micropipes (MPs) in the crystal growth of silicon carbide using computer simulation of phase contrast images. The correlated reduction is explained by the exchange of full-core dislocations in a contact-free reaction between two parallel MPs. We develop a theoretical model that describes the energetics of this process.


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