TITLE

Broadband measurement of rate-dependent viscoelasticity at nanoscale using scanning probe microscope: Poly(dimethylsiloxane) example

AUTHOR(S)
Zhonghua Xu; Kyongsoo Kim; Qingze Zou; Shrotriya, Pranav
PUB. DATE
September 2008
SOURCE
Applied Physics Letters;9/29/2008, Vol. 93 Issue 13, p133103
SOURCE TYPE
Academic Journal
DOC. TYPE
Article
ABSTRACT
A control approach to achieve nanoscale broadband viscoelastic measurement using scanning probe microscope (SPM) is reported. Current SPM-based force measurement is too slow to measure rate-dependent phenomena, and large (temporal) measurement errors can be generated when the sample itself changes rapidly. The recently developed model-less inversion-based iterative control technique is used to eliminate the dynamics and hysteresis effects of the SPM hardware on the measurements, enabling rapid excitation and measurement of rate-dependent material properties. The approach is illustrated by the mechanical characterization of poly(dimethylsiloxane) over a broad frequency range of three orders of magnitude (∼1 Hz to 4.5 KHz).
ACCESSION #
34771947

 

Related Articles

  • Imaging Mechanical Properties of Living Cells by Scanning Probe Microscopy. Haga, Hisashi; Nagayama, Masafumi; Kawabata, Kazushige // Current Nanoscience;Feb2007, Vol. 3 Issue 1, p97 

    Scanning probe microscope (SPM) has been developed as a powerful tool for obtaining high resolution topographic images of biological samples in their natural aqueous environment. SPM can also be used to evaluate mechanical properties because its probe is physically in contact with the samples...

  • Formation of fine near-field scanning optical microscopy tips. Part I. By static and dynamic chemical etching. Lazarev, Alexander; Fang, Nicholas; Luo, Qi; Zhang, Xiang // Review of Scientific Instruments;Aug2003, Vol. 74 Issue 8, p3679 

    The probe tip is the key component in scanning probe microscopes and their applications in the nanoscale imaging and nanofabrication. In this work, we have investigated the formation of near-field scanning optical microscopy probe tips from optical fiber by chemical etching. Static and dynamic...

  • Locally induced charged states in La0.89Sr0.11MnO3 single crystals. Mamin, R. F.; Bdikin, I. K.; Kholkin, A. L. // Applied Physics Letters;6/1/2009, Vol. 94 Issue 22, p222901 

    Scanning probe microscopy was used to create and to detect local bias induced charged states in La0.89Sr0.11MnO3 single crystals at room temperature. The lifetime of these nonequilibrium states exceeds 100 h. These bias induced states display also a ferroelectriclike hysteresis with...

  • Wide bandwidth transimpedance amplifier for extremely high sensitivity continuous measurements. Ferrari, Giorgio; Sampietro, Marco // Review of Scientific Instruments;Sep2007, Vol. 78 Issue 9, p094703 

    This article presents a wide bandwidth transimpedance amplifier based on the series of an integrator and a differentiator stage, having an additional feedback loop to discharge the standing current from the device under test (DUT) to ensure an unlimited measuring time opportunity when compared...

  • Ultralow nanoscale wear through atom-by-atom attrition in silicon-containing diamond-like carbon. Bhaskaran, Harish; Gotsmann, Bernd; Sebastian, Abu; Drechsler, Ute; Lantz, Mark A.; Despont, Michel; Jaroenapibal, Papot; Carpick, Robert W.; Chen, Yun; Sridharan, Kumar // Nature Nanotechnology;Mar2010, Vol. 5 Issue 3, p181 

    Understanding friction and wear at the nanoscale is important for many applications that involve nanoscale components sliding on a surface, such as nanolithography, nanometrology and nanomanufacturing. Defects, cracks and other phenomena that influence material strength and wear at macroscopic...

  • Capturing and depositing one nanoobject at a time: Single particle dip-pen nanolithography. Wang, Ying; Zhang, Yi; Li, Bin; Lü, Junhong; Hu, Jun // Applied Physics Letters;3/26/2007, Vol. 90 Issue 13, p133102 

    A convenient technique for transferring nanoparticles in a one-particle-at-a-time fashion is presented. This technique, termed as single particle dip-pen nanolithography, employs an atomic force microscope (AFM) tip to “grab” individual gold nanoparticles on surfaces. The...

  • Contacting a single molecular wire by STM manipulation. Moresco, F.; Gross, L.; Grill, L.; Alemani, M.; Gourdon, A.; Joachim, C.; Rieder, K.H. // Applied Physics A: Materials Science & Processing;2005, Vol. 80 Issue 5, p913 

    The Lander molecule (C90H98) consists of a long polyaromatic molecular wire and four lateral di-tert-butyl-phenyl spacer groups, designed to maintain the molecular wire parallel above the substrate. It represents a model system for investigating the electronic contacts of a molecular wire to a...

  • Surface Reconstruction of Pt/Si(001). Ji, C.; Ragan, R.; Kim, S.; Chang, Y.A.; Chen, Y.; Ohlberg, D.A.A.; Williams, R. Stanley // Applied Physics A: Materials Science & Processing;Mar2005, Vol. 80 Issue 6, p1301 

    Platinum-induced surface reconstructions on Si(001) were investigated by scanning tunneling microscopy. The Si(001) surface shows c(4×6)+c(4×2)-type reconstruction after Pt hot deposition at 750 °C. The c(4×2) reconstruction is formed by regular arrangement of Pt ad-atoms at the...

  • Cubism at the nanoscale. Toumey, Chris // Nature Nanotechnology;Oct2007, Vol. 2 Issue 10, p587 

    The article discusses the cubist principles and then borrow three techniques based on this principle. It presents information on pictures of the nanoscale created by a scanning probe microscope. These pictures are the end result of a multistage process that begins with touching the nanoscale,...

Share

Read the Article

Courtesy of VIRGINIA BEACH PUBLIC LIBRARY AND SYSTEM

Sorry, but this item is not currently available from your library.

Try another library?
Sign out of this library

Other Topics