TITLE

Atomic-scale chemical analyses of niobium oxide/niobium interfaces via atom-probe tomography

AUTHOR(S)
Yoon, Kevin E.; Seidman, David N.; Antoine, Claire; Bauer, Pierre
PUB. DATE
September 2008
SOURCE
Applied Physics Letters;9/29/2008, Vol. 93 Issue 13, p132502
SOURCE TYPE
Academic Journal
DOC. TYPE
Article
ABSTRACT
Niobium is the metal of choice for superconducting radio-frequency cavities for the future International Linear Collider. We present the results of atomic-scale characterization of the oxidation of niobium utilizing local-electrode atom-probe tomography employing picosecond laser pulsing. Laser pulsing is utilized to prevent a tip from fracturing as a buried niobium oxide/niobium interface is dissected on an atom-by-atom basis. The thickness of niobium oxide is about 15 nm, the root-mean-square chemical roughness is 0.4 nm, and the composition is close to Nb2O5, which is an insulator, with an interstitial oxygen concentration profile in Nb extending to a depth of 12 nm.
ACCESSION #
34771893

 

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