TITLE

Optical constants of silicon in near infrared region

AUTHOR(S)
Mendeleyev, V. Ya.; Skovorodko, S. N.; Lubnin, E. N.; Prosvirikov, V. M.
PUB. DATE
September 2008
SOURCE
Applied Physics Letters;9/29/2008, Vol. 93 Issue 13, p131916
SOURCE TYPE
Academic Journal
DOC. TYPE
Article
ABSTRACT
Refractive index (n) and extinction coefficient (χ) spectra for n-type silicon with impurity concentrations Ni=2.3×1012 cm-3 and Ni=4.5×1018 cm-3 are determined from measured reflectance and transmittance of silicon samples in the 0.7–1.8 μm range. In the 0.81–0.92 μm range, the spectra have a region of the anomalous dispersion and peaks, which are associated with interband transitions. It was found that the increase in Ni leads to increasing n and χ in the ranges of 0.70–0.81 and 0.90–1.80 μm, respectively, and decreasing n in the 0.86–1.80 μm range. For Ni=2.3×1012 cm-3, χ depends slightly on wavelength in the 1.15–1.8 μm range.
ACCESSION #
34771868

 

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