Local work function measurements of epitaxial graphene

Filleter, T.; Emtsev, K. V.; Seyller, Th.; Bennewitz, R.
September 2008
Applied Physics Letters;9/29/2008, Vol. 93 Issue 13, p133117
Academic Journal
The work function difference between single layer and bilayer graphene grown epitaxially on 6H-SiC(0001) has been determined to be 135±9 meV by means of the Kelvin probe force microscopy. Bilayer films are found to increase the work function as compared to single layer films. This method allows an unambiguous distinction between interface layer, single layer, and bilayer graphene. In combination with high-resolution topographic imaging, the complex step structure of epitaxial graphene on SiC can be resolved with respect to substrate and graphene layer steps.


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