TITLE

The density of states in thin film copper phthalocyanine measured by Kelvin probe force microscopy

AUTHOR(S)
Celebi, K.; Jadhav, P. J.; Milaninia, K. M.; Bora, M.; Baldo, M. A.
PUB. DATE
August 2008
SOURCE
Applied Physics Letters;8/25/2008, Vol. 93 Issue 8, p083308
SOURCE TYPE
Academic Journal
DOC. TYPE
Article
ABSTRACT
The density of states (DOS) is an important factor in understanding charge transport in organic semiconductors. We use Kelvin probe force microscopy to find the DOS in thin films of copper phthalocyanine (CuPC). We find an exponential DOS with a characteristic energy of 0.11 eV over a 0.5 eV range of the highest occupied molecular orbital of CuPC. We also find that the technique is limited by charge trapping and hysteresis at low DOSs, and nonuniform potential profiles within the CuPC film at high DOSs.
ACCESSION #
34198777

 

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