Conducting polymer formed by low energy gold ion implantation

Salvadori, M. C.; Cattani, M.; Teixeira, F. S.; Brown, I. G.
August 2008
Applied Physics Letters;8/18/2008, Vol. 93 Issue 7, p073102
Academic Journal
A buried conducting layer of metal/polymer nanocomposite was formed by very low energy gold ion implantation into polymethylmethacrylate. The conducting layer is ∼3 nm deep and of width ∼1 nm. In situ resistivity measurements were performed as the implantation proceeded, and the conductivity thus obtained as a function of buried gold concentration. The measured conductivity obeys the behavior well established for composites in the percolation regime. The critical concentration, below which the polymer remains an insulator, is attained at a dose ∼1.0×1016 atoms/cm2 of implanted gold ions.


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