TITLE

Total secondary-electron yield of metals measured by a dynamic method

AUTHOR(S)
Pintao, Carlos A. Fonzar; Hessel, Roberto
PUB. DATE
July 2000
SOURCE
Journal of Applied Physics;7/1/2000, Vol. 88 Issue 1, p478
SOURCE TYPE
Academic Journal
DOC. TYPE
Article
ABSTRACT
Discusses dynamic measurements of the total secondary-electron emission yield from metals where volume charges are prevented. Background on the dynamic method (DM) measurements; Comparison with the results obtained through pulse method.
ACCESSION #
3405999

 

Related Articles

Share

Read the Article

Courtesy of THE LIBRARY OF VIRGINIA

Sorry, but this item is not currently available from your library.

Try another library?
Sign out of this library

Other Topics