TITLE

SEMI publishes standards to tackle critical manufacturing issues

AUTHOR(S)
Mutschler, Ann Steffora
PUB. DATE
June 2008
SOURCE
Electronic News;6/30/2008, Vol. 54 Issue 26, p11
SOURCE TYPE
Trade Publication
DOC. TYPE
Article
ABSTRACT
The article reports on the new standards on critical manufacturing issues published by the industry association Semi. It notes on an effort to address critical manufacturing challenges in the flat panel display (FPD), Microelectromechanical system (MEMS) and semiconductor industries that must be covered in the new specifications. Furthermore, it presents on the standards that are being released in 2008.
ACCESSION #
33219072

 

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