IMEC Reports Methodology to Analyze Process Variability Compatible with DFM Tools

March 2008
Portable Design;Mar2008, Vol. 14 Issue 3, p9
The article focuses on the variability-aware modeling (VAM) flow developed by IMEC to analyze process variability of sub-45 nanometer (nm) technologies compatible with commercial design for manufacturing (DFM) tools. The flow facilitates the impact of process variations and degradation effects of sub-45 nm technologies on the system performance by giving valuable information to the designer. IMEC developed the flow for percolating information on proces variability of sub-45 nm technology from transistors to the system level. VAM allows IP block and system designers to make predictive assessment of architecture design options and determine design bottlenecks before manufacturing.


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