Harnessing bifurcations in tapping-mode atomic force microscopy to calibrate time-varying tip-sample force measurements

Sahin, Ozgur
October 2007
Review of Scientific Instruments;Oct2007, Vol. 78 Issue 10, p103707
Academic Journal
Torsional harmonic cantilevers allow measurement of time-varying tip-sample forces in tapping-mode atomic force microscopy. Accuracy of these force measurements is important for quantitative nanomechanical measurements. Here we demonstrate a method to convert the torsional deflection signals into a calibrated force wave form with the use of nonlinear dynamical response of the tapping cantilever. Specifically the transitions between steady oscillation regimes are used to calibrate the torsional deflection signals.


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