TITLE

Harnessing bifurcations in tapping-mode atomic force microscopy to calibrate time-varying tip-sample force measurements

AUTHOR(S)
Sahin, Ozgur
PUB. DATE
October 2007
SOURCE
Review of Scientific Instruments;Oct2007, Vol. 78 Issue 10, p103707
SOURCE TYPE
Academic Journal
DOC. TYPE
Article
ABSTRACT
Torsional harmonic cantilevers allow measurement of time-varying tip-sample forces in tapping-mode atomic force microscopy. Accuracy of these force measurements is important for quantitative nanomechanical measurements. Here we demonstrate a method to convert the torsional deflection signals into a calibrated force wave form with the use of nonlinear dynamical response of the tapping cantilever. Specifically the transitions between steady oscillation regimes are used to calibrate the torsional deflection signals.
ACCESSION #
27420445

 

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