Conformational degree and molecular orientation in rubrene film by in situ x-ray absorption spectroscopy

Wang, Li; Chen, Shi; Liu, Lei; Qi, Dongchen; Gao, Xingyu; Subbiah, Jegadesan; Swaminathan, Sindhu; TS Wee, Andrew
September 2007
Journal of Applied Physics;Sep2007, Vol. 102 Issue 6, p063504
Academic Journal
The conformation degree and molecular orientation during the growth of rubrene films on Si(111) and Au(111) have been studied by in situ x-ray absorption spectroscopy. The backbones of rubrene molecules on Au(111) are twisted at the first few layers; in contrast, no appreciable twisting is observed on Si(111) even at a thickness of approximately 1.5 nm. The planarization of the backbone in the first few layers is due to strong molecule–substrate interactions between rubrene and Si(111). The rubrene molecules on Au(111) have a backbone tilt angle of 41° and a phenyl side group tilt of 64° with respect to the substrate surface, suggesting the crystalline nature of the films. Ex situ atomic force microscopy measurements confirm that the rubrene film grown on Au(111) is crystalline and the growth direction is along its crystallographic c axis.


Related Articles

  • From clusters to fibers: Parameters for discontinuous para-hexaphenylene thin film growth. Kankate, Laxman; Balzer, Frank; Niehus, Horst; Rubahn, Horst-Günter // Journal of Chemical Physics;2/28/2008, Vol. 128 Issue 8, p084709 

    All relevant steps of discontinuous thin film growth of para-hexaphenylene on muscovite mica (0 0 1) from wetting layer over small and large clusters to nanofibers are observed and investigated in detail by a combined polarized fluorescence and atomic force microscopy study. From a variation of...

  • Leakage currents at crystallites in ZrAlxOy thin films measured by conductive atomic-force microscopy. Bierwagen, O.; Geelhaar, L.; Gay, X.; Piesˇiņsˇ, M.; Riechert, H.; Jobst, B.; Rucki, A. // Applied Physics Letters;6/4/2007, Vol. 90 Issue 23, p232901 

    The spatial distribution of the leakage current through ZrAlxOy thin films with different degrees of crystallinity was investigated at the nanometer-scale. Conductive atomic-force microscopy shows leakage currents at low electric fields in the polycrystalline but not in the amorphous films....

  • Effects of Thermal Annealing and Film Thickness on the Structural and Morphological Properties of Titanium Dioxide Films. Çörekçí, S.; Kizilkaya, K.; Asar, T.; Öztürk, M. K.; Çakmak, M.; Özçelík, S. // Acta Physica Polonica, A.;Jan2012, Vol. 121 Issue 1, p247 

    Titanium dioxide (TiO2) thin films having different thicknesses of 220, 260, and 300 nm were deposited onto well-cleaned n-type silicon substrates by reactive DC magnetron sputtering and annealed in the range of 200-1000°C in steps of 200°C. The effects of thermal annealing and thickness...

  • Thermally activated dewetting of organic thin films: the case of pentacene on SiO2 and gold. Käfer, D.; Wöll, C.; Witte, G. // Applied Physics A: Materials Science & Processing;Apr2009, Vol. 95 Issue 1, p273 

    The morphology of pentacene organic thin films deposited on SiO2 and Au(111) surfaces using organic molecular beam deposition (OMBD) has been characterized by a multi-technique approach. Among the techniques applied were X-ray photoelectron spectroscopy (XPS), atomic force microscopy (AFM),...

  • Growth, structure, and mechanical properties of hydrogenated amorphous carbon nitride films deposited by CH3CN dielectric barrier discharges. Niu, Jinhai; Liu, Dongping; Cai, Haibo; Liu, Yang; Cui, Suolin // Journal of Applied Physics;Mar2010, Vol. 107 Issue 6, p063515 

    Hydrogenated amorphous carbon nitride (a-C:N:H) films were synthesized with CH3CN dielectric barrier discharges (DBD) plasmas. The effects of varying the CH3CN pressure (p) and the frequency of the power supply (f) on the film growth and film properties were studied. The deposited films were...

  • Morphology and electronic properties of the pentacene on cobalt interface. Tiba, M. V.; de Jonge, W. J. M.; Koopmans, B.; Jonkman, H. T. // Journal of Applied Physics;11/1/2006, Vol. 100 Issue 9, p093707 

    In this paper, we report the structural and electronic properties of pentacene thin films grown on a polycrystalline Co film using atomic force microscopy and ultraviolet photoemission spectroscopy (UPS), respectively. Investigation of this type of interface is of importance for the engineering...

  • Conducting-AFM spectroscopy on ultrathin SiO[sub 2] films. Ando, A.; Miki, K.; Hasunuma, R.; Nishioka, Y. // Applied Physics A: Materials Science & Processing;2001, Vol. 72 Issue 8, pS223 

    Abstract. We study the dielectric degradation phenomena of ultrathin SiO[sub 2] films using conducting-AFM spectroscopy in a vacuum (1 x 10[sup -5] Pa). In successive current-voltage characteristics, a change of the carrier transport (from Fowler-Nordheim tunneling to direct tunneling) and...

  • Recording properties of CoCrPt tape media sputter-deposited at room temperature on polymeric substrates. Lee, Hwan-Soo; Laughlin, David E.; Bain, James A. // Journal of Applied Physics;5/15/2003, Vol. 93 Issue 10, p7783 

    Recording properties of CoCrPt thin films sputter-deposited on polymeric substrates at room temperature were investigated. Typical frequency spectra of the readback signal from sputtered tapes at various recording densities revealed an appreciable amount of modulation noise, despite the fact...

  • Atomic force acoustic microscopy methods to determine thin-film elastic properties. Hurley, D. C.; Shen, K.; Jennett, N. M.; Turner, J. A. // Journal of Applied Physics;8/15/2003, Vol. 94 Issue 4, p2347 

    We discuss atomic force acoustic microscopy (AFAM) methods to determine quantitative values for the elastic properties of thin films. The AFAM approach measures the frequencies of an AFM cantilever's first two flexural resonances while in contact with a material. The indentation modulus M of an...


Read the Article


Sorry, but this item is not currently available from your library.

Try another library?
Sign out of this library

Other Topics