TITLE

Precise atomic force microscope cantilever spring constant calibration using a reference cantilever array

AUTHOR(S)
Gates, Richard S.; Reitsma, Mark G.
PUB. DATE
August 2007
SOURCE
Review of Scientific Instruments;Aug2007, Vol. 78 Issue 8, p086101
SOURCE TYPE
Academic Journal
DOC. TYPE
Article
ABSTRACT
A method for calibrating the stiffness of atomic force microscope (AFM) cantilevers is demonstrated using an array of uniform microfabricated reference cantilevers. A series of force-displacement curves was obtained using a commercial AFM test cantilever on the reference cantilever array, and the data were analyzed using an implied Euler-Bernoulli model to extract the test cantilever spring constant from linear regression fitting. The method offers a factor of 5 improvement over the precision of the usual reference cantilever calibration method and, when combined with the Système International traceability potential of the cantilever array, can provide very accurate spring constant calibrations.
ACCESSION #
26520545

 

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