TITLE

Possible manifestation of spin fluctuations in the temperature behavior of the resistivity of Sm1.85Ce0.15CuO4 thin films

AUTHOR(S)
Sergeenkov, S.; Lanfredi, A.; Araujo-Moreira, F.
PUB. DATE
July 2007
SOURCE
JETP Letters;Jul2007, Vol. 85 Issue 11, p592
SOURCE TYPE
Academic Journal
DOC. TYPE
Article
ABSTRACT
A pronounced step-like (kink) behavior in the temperature dependence of resistivity ρ( T) is observed in the optimally doped Sm1.85Ce0.15CuO4 thin films around T sf = 87 K and attributed to the manifestation of strong-spin fluctuations induced by Sm3+ moments with the energy ħωsf = k B T sf ≃ 7 meV. The experimental data are found to be well fitted by the residual (zero-temperature) ρres, electron-phonon ρe-ph( T) = AT, and electron-electron ρe-e( T) = BT 2 contributions in addition to the fluctuation-induced contribution ρsf( T) due to thermal broadening effects (of the width ωsf). According to the best fit, the plasmon frequency, impurity scattering rate, electron-phonon coupling constant, and Fermi energy are estimated as ωp = 2.1 meV, τ = 9.5 × 10−14 s−1, λ = 1.2, and E F = 0.2 eV, respectively.
ACCESSION #
26034979

 

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