Software enables optimized epi structure in a single wafer growth

Moloney, Jerome
July 2007
Laser Focus World;Jul2007, Vol. 43 Issue 7, p59
The article cites a study that demonstrated an ability to predict a semiconductor laser input-output characteristic without using any adjustable fit parameters in wafer growth. The objective of the research was accomplished through the use of a spectral lineshape software solution at low external light illumination intensities. Moreover, the lineshape produced photoluminiscence spectra that generated invaluable feedback on growth and accuracy of the semiconductor-wafer grower.


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