Time dependent plasticity at real nanoscale deformation

Wang, F.; Huang, P.; Xu, K. W.
April 2007
Applied Physics Letters;4/16/2007, Vol. 90 Issue 16, p161921
Academic Journal
Nanoindentation creep test has been carried out in displacement of 4–100 nm regime at single grained (SG) Cu and ultrafine grained (UFG) Cu. The strain rate sensitivity m has been determined and exhibits strong indentation size effect. The magnitudes of m in UFG and SG Cu are comparable and can be simulated by the same curve below a critical depth. The authors experimental findings and analysis support that the tip-sample diffusion is the dominant mechanism below a critical indentation depth and the effect of grain boundary media mechanisms will emerge as the indenter penetrates deeper.


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