TITLE

Nanometrics, Nova settle patent litigation

AUTHOR(S)
Mutschler, Ann Steffora
PUB. DATE
April 2007
SOURCE
Electronic News;4/16/2007, Vol. 53 Issue 16, p50
SOURCE TYPE
Trade Publication
DOC. TYPE
Article
ABSTRACT
The article reports on the settlement of three patent suits between semiconductor metrology equipment supplier Nanometrics Inc. and Nova Measuring Instruments Ltd. Under the settlement, the firms dismissed, without prejudice, all pending patent litigation and have entered into a covenant not to sue one another for any patent for a period of one year. Nova Measuring initiated the litigation when it filed a suit claiming Nanometrics infringed on certain integrated metrology products.
ACCESSION #
24834744

 

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