LVDS drives boundary scan test adoption

November 2006
Electronics Weekly;11/15/2006, Issue 2265, p10
Trade Publication
The increasing popularity of high speed digital interfaces, such as low voltage differential signaling, is driving the move towards using the latest version of boundary scan testing based on the IEEE1149.6 standard. James Stanbridge, sales manager, JTAG Technologies, said the increasing use of advanced telecom computing architecture and MicroTCA is also driving use of the technology.


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