Comparison of density fluctuation measurements between O-mode and X-mode reflectometry on Tore Supra

Gerbaud, T.; Clairet, F.; Sabot, R.; Sirinelli, A.; Heuraux, S.; Leclert, G.; Vermare, L.
October 2006
Review of Scientific Instruments;Oct2006, Vol. 77 Issue 10, p10E928
Academic Journal
Reflectometry is a versatile diagnostic which allows both electronic density profile and density fluctuation measurements. Fast sweep heterodyne technique is particularly suitable for precise measurement of the phase of the reflected signal, which records the story of the wave propagation through the plasma up to the cutoff layer, including the density fluctuations. The present article exhibits a comparison of the density fluctuation radial profile measurements between fast sweep frequency technique, both using O-mode and X-mode polarizations, and fixed frequency technique. The correct agreement between all measurements of the relative values of the density fluctuation profiles reinforces the validity of the approximations used.


Related Articles

  • Semiconductor optical amplifier gain anisotropy: confinement factor against material gain. Wang, W.; Allaart, K.; Lenstra, D. // Electronics Letters;12/9/2004, Vol. 40 Issue 25, p1602 

    It is shown that different TE/TM mode confinement factors in a bulk semiconductor optical amplifier could not be the main reason for the gain anisotropy. Instead, the intrinsic material gain difference for TE/TM polarised light can well account for this anisotropy and its dependence on pump current.

  • Rapidly tunable all-optical wavelength converter based on single semiconductor optical amplifier delay interferometer. Kauer, M.; Leuthold, J.; Duelk, M.; Girault, M. // Optical & Quantum Electronics;Jan2003, Vol. 35 Issue 2, p139 

    We demonstrate a rapidly tunable 10 Gb/s all-optical wavelength converter based on a semiconductor optical amplifier delay interferometer and a tunable laser. It uses a 16-channel 100 GHz-spacing digitally tunable multifrequency laser based on a novel external-cavity laser design. The bit...

  • 160 Gbit/s SOA all-optical wavelength converter and assessment of its regenerative properties. Leuthold, J.; Möller, L.; Jaques, J.; Cabot, S.; Zhang, L.; Bernasconi, P.; Cappuzzo, M.; Gomez, L.; Laskowski, E.; Chen, E.; Wong-Foy, A.; Griffin, A. // Electronics Letters;4/29/2004, Vol. 40 Issue 9, p554 

    The article focuses on 160 Gbit/s SOA all-optical wavelength converter. The article assesses its regenerative properties. 160 Gbit/s all-optical wavelength conversion has been reported using different techniques in various material systems. All-optical regeneration and in particular retiming...

  • Sensitive 320 Gbit/ s eye diagram measurements via optical sampling with semiconductor optical amplifier-ultrafast nonlinear interferometer. Inuk Kang; Dreyer, K.F. // Electronics Letters;7/10/2003, Vol. 39 Issue 14, p1081 

    High bit rate (320 Gbit/s) all-optical eye measurements requiring only milliwatt signal power and 25 fJ sampling pulse energy are reported. The system is based on a semiconductor optical amplifier interferometer with time-domain filtering of the ASE noise.

  • Passive depolariser based on artificial polarisation-dependent delay. Liu, J.; Fang, Q.; Yin, Y.; Liang, M. // Electronics Letters;3/30/2006, Vol. 42 Issue 7, p412 

    A passive depolariser based on artificial polarisation-dependent delay is demonstrated. Experimental results show that a low degree of polarisation (<2%) and a low polarisation-dependent loss (0.08 dB) are obtained for any input state of polarisation.

  • Generation of fast neutrals in a laser-blow-off of LiF–C film: A formation mechanism. Singh, R. K.; Kumar, Ajai; Prahlad, V.; Joshi, H. C. // Applied Physics Letters;4/28/2008, Vol. 92 Issue 17, p171502 

    The temporal profiles of the spectral lines Li I and Li II emitted by a laser blow off of LiF–C film were analyzed. Fast neutrals having energies of ∼310 eV were observed. It was found that these fast neutrals have kinetic energies similar to that of the ablated ions. Photon...

  • Multifunction test targets are used to test and calibrate imaging systems. Zuech, Nello // Vision Systems Design;Nov2008, Vol. 13 Issue 11, pD10 

    The article discusses the use of multi-function targets for performance evaluation and calibration of imaging systems. The entry notes that features of the Max Levy Autograph targets which perform the function of several targets, including standard resolution, distortion and depth-of-field...

  • SUPER RESOLUTION FROM MULTIPLE LOW RESOLUTION IMAGES. Manaila, Florin; Boiangiu, Costin-Anton; Bucur, Ion // Journal of Information Systems & Operations Management;Dec2014, Vol. 8 Issue 2, p100 

    Although the technology of optical instruments is constantly advancing, the capture of high resolution images is limited by both the shortcomings of the imaging devices and the law of physics (uncertainty principle applied onto photons or the wave-like theory of light). The current paper...

  • Theoretical analysis of numerical aperture increasing lens microscopy. Ippolito, S. B.; Goldberg, B. B.; Ünlü, M. S. // Journal of Applied Physics;3/1/2005, Vol. 97 Issue 5, p053105 

    We present a detailed theoretical analysis and experimental results on a subsurface microscopy technique that significantly improves the light-gathering, resolving, and magnifying power of a conventional optical microscope. The numerical aperture increasing lens (NAIL) is a plano-convex lens...


Read the Article


Sorry, but this item is not currently available from your library.

Try another library?
Sign out of this library

Other Topics