TITLE

Space charge measurement in a dielectric material after irradiation with a 30 kV electron beam: Application to single-crystals oxide trapping properties

AUTHOR(S)
Vallayer, B.; Blaise, G.; Treheux, D.
PUB. DATE
July 1999
SOURCE
Review of Scientific Instruments;Jul99, Vol. 70 Issue 7, p3102
SOURCE TYPE
Academic Journal
DOC. TYPE
Article
ABSTRACT
Describes the use of a secondary electron microscope (SEM) as a device to study the space charge measurement of a dielectric material after irradiation with a 30 kV electron beam. Electron trajectories; Lateral dimension of the trapped charge zone; Effect of temperature on trapping properties of pure and chromium doped sapphire.
ACCESSION #
2291281

 

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