TITLE

Novel method for unambiguous ion identification in mixed ion beams extracted from an electron beam ion trap

AUTHOR(S)
Meissl, W.; Simon, M. C.; López-Urrutia, J. R. Crespo; Tawara, H.; Ullrich, J.; Winter, Hp.; Aumayr, F.
PUB. DATE
September 2006
SOURCE
Review of Scientific Instruments;Sep2006, Vol. 77 Issue 9, p093303
SOURCE TYPE
Academic Journal
DOC. TYPE
Article
ABSTRACT
A novel technique to identify small fluxes of mixed highly charged ion beams extracted from an electron beam ion trap is presented and practically demonstrated. The method exploits projectile charge state dependent potential emission of electrons as induced by ion impact on a metal surface to separate ions with identical or very similar mass-to-charge ratio.
ACCESSION #
22578502

 

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