Modified atomic force microscope for high-rate dynamic force spectroscopy

Ptak, A.; Kappl, M.; Butt, H.-J.
June 2006
Applied Physics Letters;6/26/2006, Vol. 88 Issue 26, p263109
Academic Journal
Usually adhesion forces between interfaces increase with the rate of separating the interfaces. One of the most popular instruments for such rate-dependent adhesion experiments (also called dynamic force spectroscopy) is the atomic force microscope (AFM). A limitation of this as well as that of other experimental techniques is the maximum loading rate that can be applied. We extended the range of loading rates of a commercial AFM by up to three orders of magnitude by integration of a small additional piezoactuator with high resonance frequency. Performance of the instrument is demonstrated for a model system of self-assembled monolayers of thiols.


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