TITLE

Modified atomic force microscope for high-rate dynamic force spectroscopy

AUTHOR(S)
Ptak, A.; Kappl, M.; Butt, H.-J.
PUB. DATE
June 2006
SOURCE
Applied Physics Letters;6/26/2006, Vol. 88 Issue 26, p263109
SOURCE TYPE
Academic Journal
DOC. TYPE
Article
ABSTRACT
Usually adhesion forces between interfaces increase with the rate of separating the interfaces. One of the most popular instruments for such rate-dependent adhesion experiments (also called dynamic force spectroscopy) is the atomic force microscope (AFM). A limitation of this as well as that of other experimental techniques is the maximum loading rate that can be applied. We extended the range of loading rates of a commercial AFM by up to three orders of magnitude by integration of a small additional piezoactuator with high resonance frequency. Performance of the instrument is demonstrated for a model system of self-assembled monolayers of thiols.
ACCESSION #
21845876

 

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