DFM Is Real, Impacting Yield Today, Mentor's Rhines Says

Mutschler, Ann Steffora
July 2006
Electronic News;7/17/2006, Vol. 52 Issue 29, p38
Trade Publication
This article explains that while much noise is made about design for manufacturing, Mentor Graphics Corp.'s chairman and CEO Wally Rhines said during a keynote speech in San Francisco, California at the Semicon West trade show that there are good reasons for the noise, and all of it is having an impact on yields today. To understand yield, it helps to recall that some designers turn out better designs than others, Rhines said. Designs are becoming sensitive to process variations, Rhines explained, with one of the principle reasons attributed to the fact that feature-based defects becoming a bigger percent of yield loss as compared to particle defects. Due to these feature-based defects, a design can meet all design rule checks, but because of optical effects at 65nm and below, can actually fail.


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