Scanning tunneling microscope measures the spin-excitation spectrum of atomic-scale magnets

Wilson, Mark
July 2006
Physics Today;Jul2006, Vol. 59 Issue 7, p13
Academic Journal
The article provides information on a study on the use of scanning tunneling microscopes in measuring the spin-excitation spectrum of atomic-scale magnets. IBM researchers Cyrus Hirjibehedin, Christopher Lutz and Andreas Heinrich incrementally ramp up the voltage on a scanning tunneling microscope tip positioned over an individual cluster of atoms. At some threshold, the voltage and hence the electron's kinetic energy, becomes high enough to flip the cluster's collective spin. The energy difference in spin configurations provides a direct measure of J.


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