TITLE

Mapping the local nanostructure inside a specimen by tomographic small-angle x-ray scattering

AUTHOR(S)
Schroer, C. G.; Kuhlmann, M.; Roth, S. V.; Gehrke, R.; Stribeck, N.; Almendarez-Camarillo, A.; Lengeler, B.
PUB. DATE
April 2006
SOURCE
Applied Physics Letters;4/17/2006, Vol. 88 Issue 16, p164102
SOURCE TYPE
Academic Journal
DOC. TYPE
Article
ABSTRACT
Small-angle x-ray scattering is combined with scanning microtomography to reconstruct the small-angle diffraction pattern in the direction of the tomographic rotation axis at each location on a virtual section through a specimen. These data yield information about the local nanoscale structure of the sample. With rotational symmetry present in the diffraction patterns, e.g., for isotropic or fiber-textured scatterers, the full reciprocal space information in the small-angle scattering regime can be reconstructed at each location inside the specimen. The method is illustrated investigating a polymer rod made by injection molding.
ACCESSION #
20695116

 

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