A unifying view on some experimental effects in tapping-mode atomic force microscopy

Marth, M.; Maier, D.
May 1999
Journal of Applied Physics;5/15/1999, Vol. 85 Issue 10, p7030
Academic Journal
Examines several experimental effects that occur in tapping-mode atomic force microscopy such as apparent hysteresis effects in force probes and frequency sweeps and distortions in imaging. Experimental details; Explanation of the observed experimental effects; Conclusion.


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