High-throughput x-ray characterization system for combinatorial materials studies

Zhenlin Luo; Bin Geng; Jun Bao; Cihui Liu; Wenhan Liu; Chen Gao; Zhiguo Liu; Xunliang Ding
September 2005
Review of Scientific Instruments;Sep2005, Vol. 76 Issue 9, p095105
Academic Journal
We have developed a high-throughput x-ray characterization system, which can rapidly screen structure, composition and x-ray scintillation of combinatorial materials libraries using energy-dispersive x-ray diffraction, x-ray fluorescence, and x-ray photoluminescence. This system consists of an x-ray source, a polycapillary x-ray lens, one or two x-ray energy detectors, and a fiber optic spectrometer. A Windows-based software package was also developed to control the measurement system and data acquisition automatically. Examples are also demonstrated to show the applicability of this system.


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