True atomic resolution in liquid by frequency-modulation atomic force microscopy

Fukuma, Takeshi; Kobayashi, Kei; Matsushige, Kazumi; Yamada, Hirofumi
July 2005
Applied Physics Letters;7/18/2005, Vol. 87 Issue 3, p034101
Academic Journal
True atomic resolution of frequency-modulation atomic force microscopy in liquid is demonstrated. Hexagonal lattice of a cleaved (001) surface of muscovite mica is resolved in water. Nonperiodic structures such as defects and adsorbates are simultaneously imaged with the atomic-scale features of mica surface. The use of small oscillation amplitude (0.16–0.33 nm) of a force sensing cantilever allows us to obtain vertical and lateral resolutions of 2–6 and 300 pm, respectively, even with a low Q factor in water (Q=20–30).


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