Interface magnetization profiling by x-ray magnetometry of marker impurities on Fe/GaAs(001)-(4×6)

Giovanelli, L.; Panaccione, G.; Rossi, G.; Fabrizioli, M.; Tian, C. S.; Gastelois, P. L.; Fujii, J.; Back, C. H.
July 2005
Applied Physics Letters;7/25/2005, Vol. 87 Issue 4, p042506
Academic Journal
We use Co atoms dispersed in a ferromagnetic Fe film as a magnetic marker material to probe the magnetic properties of the Fe film grown epitaxially on GaAs(001)-(4×6). X-ray magnetic circular dichroism on Co L2,3 edges has been used to perform, in a Mössbauer-like experiment, a layer-dependent analysis. We find an enhancement of the Co orbital magnetic moment near the interface with the GaAs substrate, as well as a decrease of the spin magnetic moment when approaching the interface and at the surface of the Fe film.


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