Anisotropy of thermal expansion in YAlO3 and NdGaO3

Chaix-Pluchery, O.; Chenevier, B.; Robles, J. J.
June 2005
Applied Physics Letters;6/20/2005, Vol. 86 Issue 25, p251911
Academic Journal
YAlO3 and NdGaO3 thermal expansion coefficients were measured using in situ powder x-ray diffraction in the temperature range of 28–650 °C. They exhibit a clear anisotropy: The expansion, quite similar along the [100] and [001] directions, is much lower along the [010] direction. The formation of cracks observed in YBa2Cu3O7-δ thin films deposited on YAlO3 and NdGaO3 substrates is likely related to the anisotropy. Stress value calculations have been performed in both systems. They indicate that the intrinsic components are specifically high in YAlO3.


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