Electrical properties and logic function of multibranch junction structures

Wallin, D.; Xu, H. Q.
June 2005
Applied Physics Letters;6/20/2005, Vol. 86 Issue 25, p253510
Academic Journal
We report on room-temperature electrical measurements of multibranch junction (MBJ) devices made from a semiconductor heterostructure. We show that the MBJ devices exhibit an interesting electrical property. If the voltage output at one branch is measured as a function of the voltages inputs to all the other branches, the output voltage is determined predominately by the most negative, or the lowest, voltage applied. The property arises from the nature of the voltage-induced ballistic electron transport in the MBJ device, and can in general be observed in other nanoscale MBJ structures. We also demonstrate the realization of very compact multi-input logic gates with the MBJ structures.


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