Application of near-field scanning microwave microprobe to electrical current density mapping

Aga, Roberto S.; Xiang Wang; Dizon, Jonathan; Noffsinger, Jesse; Wu, Judy Z.
June 2005
Applied Physics Letters;6/6/2005, Vol. 86 Issue 23, p234101
Academic Journal
A near-field scanning microwave microprobe (NSMM) has been integrated with electrical current-voltage (I–V) characterization for mapping electrical current density (J) in conducting films at room temperature (RT). In this technique, the focused microwave emitted at the tip of the NSMM was used to alter the local resistance of the sample via heating which results in a voltage response ΔV that depends linearly on the local J and the applied microwave power. In addition to the ΔV map generated during the NSMM scan over a sample, a microwave response map can be recorded simultaneously using the NSMM, providing complementary information of sample morphology and surface impedance. On silver microbridges with predefined patterns, a 10-μm spatial resolution has been demonstrated and better resolution may be achieved with further optimization. Hence, this technique provides a simple and nondestructive method for identification of current-limiting defects in conducting films and may be scaled for reel-to-reel quality control of the high-Tc superconductor coated conductors at RT.


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