TITLE

Footprints of deformation mechanisms during in situ x-ray diffraction: Nanocrystalline and ultrafine grained Ni

AUTHOR(S)
Budrovic, Z.; Petegem, S. Van; Derlet, P. M.; Schmitt, B.; Swygenhoven, H. Van; Schafler, E.; Zehetbauer, M.
PUB. DATE
June 2005
SOURCE
Applied Physics Letters;6/6/2005, Vol. 86 Issue 23, p231910
SOURCE TYPE
Academic Journal
DOC. TYPE
Article
ABSTRACT
In situ x-ray diffraction demonstrates that in ultrafine grained Ni synthesized by high pressure torsion with a coherent scattering domain size of 80 nm, a dislocation network is still built up during tensile deformation whereas this is not the case for electrodeposited nanocrystalline metals with a coherent scattering domain size of 30 nm. Simultaneously, the technique shows for the first time important differences in macroscopic stress accommodation during plastic deformation between the nanocrystalline and ultrafine grained Ni, such as the origin of the reduction in flow stress.
ACCESSION #
17328442

 

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