On observation of freeze-dried smectite plane views of nanolayers

Laribi, S.; Jouffrey, B.; Fleureau, J.-M.
June 2005
Applied Physics Letters;6/6/2005, Vol. 86 Issue 23, p231915
Academic Journal
Observations were carried out on a purified and deshydrated smectite using scanning and transmission electron microscopy. They show extremely thin layers in the planar orientation (thickness of the order of a few nanometers). An important part of them is also bent with variable radii of curvature, often of the order of a few hundreds of nanometers. Some of the samples are complicated in shape, and present a succession of folds. Samples mainly grow as layers and not as a pile-up of layers. Electron energy loss spectroscopy shows that the Si/Al local ratio is of the order of 2 as expected.


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